| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor testing device capable of easily performing timing correction at the leading end of the socket, which is electrically connected to an IC to be tested, with high accuracy. SOLUTION: In the semiconductor testing device performing timing correction using an exclusive short IC, wherein all of signal pins are connected at one point, in place of the IC to be tested in order to correct the timings of a bidirectional pin at every socket and a driver exclusive pin at the leading end of the socket electrically connected to the IC to be tested to the same timing, a comparator for correcting timing connected to the driver of the driver exclusive pin only at the time of timing correction is provided and all of pins are equivalently set as bidirectional pins to enable the timing correction only by one kind of the exclusive short IC.
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