| 摘要 |
The invention concerns a MOS transistor produced in a silicon film of a SOI substrate (10), said film (13) being lightly doped and having a thickness less than 30 nm, the source (14) and drain (15) contacts being of the Schottky type with the lowest possible Schottky barrier height for the majority carriers, the operating conditions of the transistor being of the accumulative type.
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