| 摘要 |
PROBLEM TO BE SOLVED: To provide an inspection method and inspection device for barrier ribs of organic EL display device that can inspect for defect at the point of forming barrier ribs and can inspect in a short time. SOLUTION: An in-process element 2b which has made a barrier rib 25 is sampled from the manufacturing line, and a conductive layer 26 is formed on the in-process element 2b, and the short circuit between the conductive layers 26 which are partitioned by the barrier rib 25 is inspected. Thus the defect of the barrier rib 25 can be inspected without forming an organic EL layer 23 and the rear side electrode 24. Further, by connecting a conduction tester 18 in each conductive layer 26, the inspection of short circuit can be made at a time and in a short time.
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