发明名称 METHOD FOR KEEPING PRODUCTION HISTORY INFORMATION OF SEMICONDUCTOR DEVICE AND SEMICONDUCTOR PRODUCED BY THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a method for keeping a production history information of semiconductor device by which the production history information can be kept easily. SOLUTION: In a contact formation step (ST3), a production history information area 5 in each of chips 2 is simultaneously exposed with an aligner by means of a master mask, so that a hole for connecting transistors in the respective production history information area 5 is formed in an insulation layer. Thus, a exposing step can be completed by one-time processing using one master mask, and the step be also made to be simple and easy, and furthermore, the production history information can be kept easily.
申请公布号 JP2001230164(A) 申请公布日期 2001.08.24
申请号 JP20000041008 申请日期 2000.02.18
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUJIKAWA HIROSHI
分类号 H01L21/02;H01L21/66;H01L23/544;(IPC1-7):H01L21/02 主分类号 H01L21/02
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