发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a small crosstalk noise semiconductor device and its manufacturing method which can prevent diffusion of copper into a low permattrurty insulating film and reduce the permattrurty of a low-permattrurty insulating film and water absorptance. SOLUTION: An interlayer dielectric film 2 having a wiring hole 2a and an interline dielectric film 3 having a wiring trench 3a are formed on a semiconductor substrate 1. The interlayer dielectric film 2 and the interline dielectric film 3 are composed of SiO2 as a main component and contain phosphorus and hydrocarbon. Also, the connection hole 2a of the interlayer dielectric film 2 and interline film 3, and a copper wiring film 4 which covers the wiring trench 3 are formed.
申请公布号 JP2001230254(A) 申请公布日期 2001.08.24
申请号 JP20000037902 申请日期 2000.02.16
申请人 SHARP CORP 发明人 ORITA SHIROHIKO;AWAYA NOBUYOSHI
分类号 H01L21/3205;H01L21/31;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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