发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a small crosstalk noise semiconductor device and its manufacturing method which can prevent diffusion of copper into a low permattrurty insulating film and reduce the permattrurty of a low-permattrurty insulating film and water absorptance. SOLUTION: An interlayer dielectric film 2 having a wiring hole 2a and an interline dielectric film 3 having a wiring trench 3a are formed on a semiconductor substrate 1. The interlayer dielectric film 2 and the interline dielectric film 3 are composed of SiO2 as a main component and contain phosphorus and hydrocarbon. Also, the connection hole 2a of the interlayer dielectric film 2 and interline film 3, and a copper wiring film 4 which covers the wiring trench 3 are formed. |
申请公布号 |
JP2001230254(A) |
申请公布日期 |
2001.08.24 |
申请号 |
JP20000037902 |
申请日期 |
2000.02.16 |
申请人 |
SHARP CORP |
发明人 |
ORITA SHIROHIKO;AWAYA NOBUYOSHI |
分类号 |
H01L21/3205;H01L21/31;H01L21/768;H01L23/52;H01L23/522;H01L23/532;(IPC1-7):H01L21/320 |
主分类号 |
H01L21/3205 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|