发明名称 LSI SOLDERED JOINT STRUCTURE, AND LSI SOLDERED PART ABNORMAL JOINT DETECTING METHOD USED FOR IT
摘要 PROBLEM TO BE SOLVED: To provide an LSI soldered part abnormal joint detecting method allowing a soldered joint condition to be monitored in any time during operation of LSI and an abnormal joint to be detected in its early stages. SOLUTION: Joint checking solder balls 3, 4 are arranged in optional positions in the outermost circumference part of BGA 1, which is considered to have a short soldered joint lifetime theoretically because of application of the highest mechanical stress, and electrically connected to PWB 8 by means of solder. The joint checking solder ball 3 is electrically connected to the GND, and connected to the joint checking solder ball 4 via LSI internal wiring 2. The joint checking solder ball 4 is pulled up by means of a resistor 9 so as to be connected to one end (+) of a comparator 10. A reference power source Vref is connected to the other end (-) of the comparator 10. The output of the comparator 10 is connected to a soldered joint part monitoring part 11 detecting abnormal joint between the soldered joint parts 7a, 7b, and an output of the joint part monitoring part 11 is connected to a device control unit 12.
申请公布号 JP2001228191(A) 申请公布日期 2001.08.24
申请号 JP20000037338 申请日期 2000.02.16
申请人 NEC CORP 发明人 HARADA HISATSUGU
分类号 G01R31/02;H01L21/66;(IPC1-7):G01R31/02 主分类号 G01R31/02
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