发明名称 |
APPARATUS FOR MEASURING PHYSICAL PROPERTIES OF A SAMPLE |
摘要 |
An instrument for measuring a physical property of a sample by optically detecting the response of the sample to projection of an ultra-short optical pulse. A Sagnac common-path optical interferometer for measuring a physical property at a vertical input angle is provided. The interferometer is a two- arm Sagnac type and has two beam splitters. A sample (14) is excited by an ultra-short optical pulse, and changes of the strength and phase of the optical beam caused by the excitation are measured. Therefore, it is possibl e to measure a physical property in a wide range such as the thickness of an object, a sound speed, or a thermal property.
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申请公布号 |
CA2368272(A1) |
申请公布日期 |
2001.08.23 |
申请号 |
CA20002368272 |
申请日期 |
2000.06.21 |
申请人 |
JAPAN SCIENCE AND TECHNOLOGY CORPORATION |
发明人 |
MATSUDA, OSAMU;HURLEY, DAVID H.;WRIGHT, OLIVER B. |
分类号 |
G01B9/02;G01B11/06;G01N21/00;G01N21/17;G01N21/45;G01N25/16;G01N29/00;(IPC1-7):G01N21/45 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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