发明名称 APPARATUS FOR MEASURING PHYSICAL PROPERTIES OF A SAMPLE
摘要 An instrument for measuring a physical property of a sample by optically detecting the response of the sample to projection of an ultra-short optical pulse. A Sagnac common-path optical interferometer for measuring a physical property at a vertical input angle is provided. The interferometer is a two- arm Sagnac type and has two beam splitters. A sample (14) is excited by an ultra-short optical pulse, and changes of the strength and phase of the optical beam caused by the excitation are measured. Therefore, it is possibl e to measure a physical property in a wide range such as the thickness of an object, a sound speed, or a thermal property.
申请公布号 CA2368272(A1) 申请公布日期 2001.08.23
申请号 CA20002368272 申请日期 2000.06.21
申请人 JAPAN SCIENCE AND TECHNOLOGY CORPORATION 发明人 MATSUDA, OSAMU;HURLEY, DAVID H.;WRIGHT, OLIVER B.
分类号 G01B9/02;G01B11/06;G01N21/00;G01N21/17;G01N21/45;G01N25/16;G01N29/00;(IPC1-7):G01N21/45 主分类号 G01B9/02
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