发明名称 SEMICONDUCTOR DEVICE FABRICATION METHOD AND SEMICONDUCTOR DEVICE FABRICATION DEVICE
摘要 A semiconductor device fabrication method which reduces the number of production steps and streamlines a production line, and which completes each of high frequency modules by mounting and assembling chip parts (22) and semiconductor pellets (21) onto a wiring board (2) included in an inspected multiple-block substrate (27), wherein a wiring board (2), that is, a block found to be defective during the inspection of the multiple-block substrate (27) is fixed with a rejection mark (2e), and a rejection mark is identified in each of a series of assembly steps that follow to omit any work otherwise required on the wiring board (2) formed with the rejection mark (2e), thereby streamlining a production line.
申请公布号 WO0161754(A1) 申请公布日期 2001.08.23
申请号 WO2001JP01091 申请日期 2001.02.15
申请人 HITACHI, LTD.;HITACHI TOHBU SEMICONDUCTOR, LTD.;ISHIZU, AKIO;TAKASHIMA, KAZUTOSHI;OBA, SHIRO;KOBAYASHI, YOSHIHIKO;IDA, TSUTOMU;HAGA, SHIGERU;TAKADA, SUSUMU;KOUJIRO, IWAMICHI;ARAI, NORINAGA;KAKEGAWA, YUJI 发明人 ISHIZU, AKIO;TAKASHIMA, KAZUTOSHI;OBA, SHIRO;KOBAYASHI, YOSHIHIKO;IDA, TSUTOMU;HAGA, SHIGERU;TAKADA, SUSUMU;KOUJIRO, IWAMICHI;ARAI, NORINAGA;KAKEGAWA, YUJI
分类号 G01R31/26;H01L21/50;H01L21/58;H01L21/66;H01L21/98;H01L23/04;H01L23/10;H01L23/13;H01L23/498;H01L23/50;H01L23/544;H01L25/16 主分类号 G01R31/26
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