发明名称 |
Integrated circuit with test interface |
摘要 |
Integrated circuit with a test interface for testing a conductive connection between a supply pad and a supply of a functional block in the integrated circuit. A current test circuit has test inputs coupled to a first and a second point along the conductive connection, for comparing a voltage across the test inputs with a threshold. The current test circuit contains a threshold shifting circuit for shifting the threshold to a shifted value dependent on a voltage across the test inputs when the threshold shifting circuit is active. Testing is executed in two steps, making the threshold shifting circuit active when a first voltage is applied across test inputs and comparing a second voltage at the test input with the shifted threshold. One of the first and second voltage is a voltage drop across the connection when the integrated circuit is set to draw current along said connection, the other one of the first and second voltage is a reference voltage. In an embodiment the integrated circuit has a shunt circuit to provoke current through the conductive connection under test in parallel with current through the functional block.
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申请公布号 |
US2001015653(A1) |
申请公布日期 |
2001.08.23 |
申请号 |
US20010790419 |
申请日期 |
2001.02.22 |
申请人 |
U.S. PHILIPS CORPORATION. |
发明人 |
DE JONG FRANCISCUS GERARDUS MARIA;SCHUTTERT RODGER FRANK;DE WILDE JOHANNES;DEN BESTEN GERRIT WILLEM;KUP BERNARDUS MARTINUS JOHANNES;VAN UDEN ALBERTUS JAN PAULUS MARIA |
分类号 |
G01R31/28;G01R31/316;H01L21/822;H01L27/04;(IPC1-7):G01R31/02 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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