发明名称 INSTRUMENT FOR MEASURING PHYSICAL PROPERTY OF SAMPLE
摘要 <p>An instrument for measuring a physical property of a sample by optically detecting the response of the sample to projection of an ultra-short optical pulse. A Sagnac common-path optical interferometer for measuring a physical property at a vertical input angle is provided. The interferometer is a two-arm Sagnac type and has three beam splitters. A sample (14) is excited by an ultra-short optical pulse, and changes of the strength and phase of the optical beam caused by the excitation are measured. Therefore it is possible to measure a physical property in a wide range such as the thickness of an object, a sound speed, or a thermal property.</p>
申请公布号 WO2001061321(P1) 申请公布日期 2001.08.23
申请号 JP2000004029 申请日期 2000.06.21
申请人 发明人
分类号 主分类号
代理机构 代理人
主权项
地址
您可能感兴趣的专利