发明名称 Method of planarizing dielectric layer
摘要 A method of planarizing a dielectric layer comprising the steps of providing a substrate having structures already formed thereon, and then forming a borophosphosilicate glass layer over the substrate. Next, a rapid thermal process is applied heating the borophosphosilicate layer to cause a thermal flow, and then the borophosphosilicate layer is etched back so that a planar surface is obtained. Finally, a passivation layer is formed over the borophosphosilicate glass layer to prevent the formation of pits in subsequent pre-metal wet etching operations.
申请公布号 US6277754(B1) 申请公布日期 2001.08.21
申请号 US19980067548 申请日期 1998.04.27
申请人 UNITED MICROELECTRONICS CORP. 发明人 WANG BRIAN;HSU CHIH-CHING
分类号 H01L21/3105;H01L21/316;(IPC1-7):H01L21/311;H01L21/476 主分类号 H01L21/3105
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