发明名称 Reverse lithographic process for semiconductor spaces
摘要 A reverse lithographic process is provided for more densely packing semiconductors onto a semiconductor wafer. A semiconductor wafer having deposited a number of layers of semiconductor materials has a photoresist deposited which is patterned with the spaces as lines, and then developed and trimmed. A polymer is deposited over the space photoresist structures and, when hardened, is subject to planarizing to expose the photoresist. The photoresist is removed leaving a reverse image polymer which is then used as a mask to anisotropically etch the spaces to form the closely spaced devices.
申请公布号 US6277544(B1) 申请公布日期 2001.08.21
申请号 US19990329153 申请日期 1999.06.09
申请人 ADVANCED MICRO DEVICES, INC. 发明人 SINGH BHANWAR;RANGARAJAN BHARATH;QUINTO URSULA Q.
分类号 G03F7/00;G03F7/40;(IPC1-7):G03C5/00 主分类号 G03F7/00
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