发明名称 Method for decreasing contact resistance of an electrode positioned inside a misaligned via for multilevel interconnects
摘要 A method for removing a resistive film formed on an electrode to increase the conductive contact area of the electrode positioned in a misaligned contact hole. The method comprises providing a substrate supporting an electrode layer. The electrode layer is etched to produce metal lines. During the processing of the metal lines, a resistive film is formed thereon. The resistive film is removed and a protective barrier is formed on the metal lines. A dielectric layer is formed on the substrate, including the metal lines. The dielectric layer is subsequently patterned to form contact holes or vias to expose a portion of the metal lines. The contact holes are filled with plugs such that a second electrode layer can be formed on the dielectric layer and the plugs.
申请公布号 US6277726(B1) 申请公布日期 2001.08.21
申请号 US19980208202 申请日期 1998.12.09
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 KITCH VASSILI;THOMAS MICHAEL E.
分类号 H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 主分类号 H01L21/768
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