发明名称 |
Method for decreasing contact resistance of an electrode positioned inside a misaligned via for multilevel interconnects |
摘要 |
A method for removing a resistive film formed on an electrode to increase the conductive contact area of the electrode positioned in a misaligned contact hole. The method comprises providing a substrate supporting an electrode layer. The electrode layer is etched to produce metal lines. During the processing of the metal lines, a resistive film is formed thereon. The resistive film is removed and a protective barrier is formed on the metal lines. A dielectric layer is formed on the substrate, including the metal lines. The dielectric layer is subsequently patterned to form contact holes or vias to expose a portion of the metal lines. The contact holes are filled with plugs such that a second electrode layer can be formed on the dielectric layer and the plugs.
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申请公布号 |
US6277726(B1) |
申请公布日期 |
2001.08.21 |
申请号 |
US19980208202 |
申请日期 |
1998.12.09 |
申请人 |
NATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
KITCH VASSILI;THOMAS MICHAEL E. |
分类号 |
H01L21/768;H01L23/522;H01L23/532;(IPC1-7):H01L21/476 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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