发明名称 Circuit and method for a memory cell using reverse base current effect
摘要 A memory cell is provided. The memory cell includes a field-effect transistor having a source region, a drain region and a gate coupled to a wordline. The memory cell also includes a vertical bipolar junction transistor that is biased for use of the reverse base current effect to store data. The bipolar junction transistor has an emitter region formed within a source/drain region of the field-effect transistor. The emitter region is self-aligned with a minimum dimension isolation region adjacent to the memory cell and is coupled to a ground line. A portion of the source/drain region acts as the base of the bipolar junction transistor.
申请公布号 US6277701(B1) 申请公布日期 2001.08.21
申请号 US20000533122 申请日期 2000.03.23
申请人 MICRON TECHNOLOGY, INC. 发明人 NOBLE WENDELL P.
分类号 H01L27/105;(IPC1-7):H01L21/331 主分类号 H01L27/105
代理机构 代理人
主权项
地址