SEMICONDUCTOR IC TEST APPARATUS

摘要

PURPOSE: A semiconductor IC test apparatus is provided to minimize test error in the radio frequency operation of semiconductor IC into which a divider resistor for LCD is integrated. CONSTITUTION: A test apparatus comprises a timing pulse generator(16) for generating a timing pulse signal; a pattern generator(18) for generating test driving signal and reference waveform signal in response to the timing pulse signal, and supplying the test driving to semiconductor IC; a voltage generator(14) for generating reference voltage signal of low and high level; the first comparator(12) for receiving the signal which is output from the semiconductor IC in accordance with the input of the test driving signal, and comparing the timing of the output signal from the semiconductor IC with the timing of the timing pulse signal output from the timing pulse generator, in response to the reference voltage signal input from the voltage generator; the second comparator(20) for comparing voltage level of the output signal of the semiconductor IC which is input from the first comparator, with the reference level of reference waveform signal input from the pattern generator, and outputting a test result signal indicating whether the operation of the semiconductor IC is erroneous or not, in accordance with the comparison result; and a memory(22) for recording whether the operation of the semiconductor IC is erroneous or not, in response to the test result signal.