发明名称 REACTION TUBE FOR VERTICAL THERMAL TREATMENT DEVICE AND THERMAL TREATMENT APPARATUS PROVIDED THEREWITH
摘要 PURPOSE: To provide a vertical thermal treatment device reaction tube, which is capable of providing semiconductor wafers provided with oxide films of a uniform thickness, without using a mechanism that rotates the semiconductor wafers and a vertical thermal treatment apparatus provided therewith. CONSTITUTION: Reaction gas introduced through a gas inlet 1 is fed uniformly into a reaction tube 4, passing through a gas dispersion plate 2. Heat is uniformly taken away from around dummy wafers 9 located near the gas inlet 1, so that a gas flow becomes uniform in temperature distribution in the region of the dummy wafers 9. Therefore, an oxide film can be kept constant in thickness, independently of whether a rotating mechanism is provided even if a gas flow changes in the region of rear wafers 10. Accordingly, even if a mechanism which rotates the wafers is not provided, a film formed on the circumferential edge of the real wafer 10 can be set uniform in thickness. As a vertical thermal treatment apparatus is not equipped with a mechanism which rotates wafers, the apparatus can be provided at a lower cost.
申请公布号 KR20010077810(A) 申请公布日期 2001.08.20
申请号 KR20000015685 申请日期 2000.03.28
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. 发明人 MINAMI MASASHI
分类号 H01L21/22;H01L21/31;H01L21/324;(IPC1-7):H01L21/324 主分类号 H01L21/22
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