发明名称 |
METHOD FOR MANUFACTURING STORAGE ELECTRODE OF DYNAMIC RANDOM ACCESS MEMORY DEVICE |
摘要 |
PURPOSE: A method for manufacturing a storage electrode of a dynamic random access memory(DRAM) device is provided to increase pressure inside a process space, to reduce an output for manufacturing plasma, and to increase power connected to an electric field for accelerating an etching material, in at least an over-etching process. CONSTITUTION: A conductive layer is deposited on an interlayer dielectric(124) having a storage electrode contact(122), and is patterned to form a storage electrode(130) of a dynamic random access memory(DRAM) having a capacitor on bit line(COB) structure. The pressure inside a process space in an over-etching process increases by 30-100 percent as compared with a main etching process.
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申请公布号 |
KR20010077266(A) |
申请公布日期 |
2001.08.17 |
申请号 |
KR20000004937 |
申请日期 |
2000.02.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, EUN HYEONG;KO, SEONG HUN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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