发明名称 METHOD FOR MANUFACTURING STORAGE ELECTRODE OF DYNAMIC RANDOM ACCESS MEMORY DEVICE
摘要 PURPOSE: A method for manufacturing a storage electrode of a dynamic random access memory(DRAM) device is provided to increase pressure inside a process space, to reduce an output for manufacturing plasma, and to increase power connected to an electric field for accelerating an etching material, in at least an over-etching process. CONSTITUTION: A conductive layer is deposited on an interlayer dielectric(124) having a storage electrode contact(122), and is patterned to form a storage electrode(130) of a dynamic random access memory(DRAM) having a capacitor on bit line(COB) structure. The pressure inside a process space in an over-etching process increases by 30-100 percent as compared with a main etching process.
申请公布号 KR20010077266(A) 申请公布日期 2001.08.17
申请号 KR20000004937 申请日期 2000.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, EUN HYEONG;KO, SEONG HUN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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