发明名称 RINSING SOLUTION FOR PHOTOLITHOGRAPHY AND METHOD FOR TREATING SUBSTRATE WITH SAME
摘要 PROBLEM TO BE SOLVED: To provide a rinsing solution used particularly for rinsing a substrate after the treatment of residue on ashing with a removing solution in the treatment of the substrate subjected to ashing after dry etching through a photoresist pattern formed on the substrate as a mask and a method for treating a substrate with the rinsing solution. SOLUTION: The rinsing solution for photolithography has pH 8-12 and contains a chelating agent and one or more saccharides.
申请公布号 JP2001222118(A) 申请公布日期 2001.08.17
申请号 JP20000101721 申请日期 2000.04.04
申请人 TOKYO OHKA KOGYO CO LTD 发明人 WAKIYA KAZUMASA;KOBAYASHI MASAICHI
分类号 G03F7/42;C03C15/00;C03C23/00;H01L21/027;H01L21/302;H01L21/304;H01L21/306;H01L21/3065;H01L21/308;(IPC1-7):G03F7/42 主分类号 G03F7/42
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