发明名称 |
RINSING SOLUTION FOR PHOTOLITHOGRAPHY AND METHOD FOR TREATING SUBSTRATE WITH SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a rinsing solution used particularly for rinsing a substrate after the treatment of residue on ashing with a removing solution in the treatment of the substrate subjected to ashing after dry etching through a photoresist pattern formed on the substrate as a mask and a method for treating a substrate with the rinsing solution. SOLUTION: The rinsing solution for photolithography has pH 8-12 and contains a chelating agent and one or more saccharides. |
申请公布号 |
JP2001222118(A) |
申请公布日期 |
2001.08.17 |
申请号 |
JP20000101721 |
申请日期 |
2000.04.04 |
申请人 |
TOKYO OHKA KOGYO CO LTD |
发明人 |
WAKIYA KAZUMASA;KOBAYASHI MASAICHI |
分类号 |
G03F7/42;C03C15/00;C03C23/00;H01L21/027;H01L21/302;H01L21/304;H01L21/306;H01L21/3065;H01L21/308;(IPC1-7):G03F7/42 |
主分类号 |
G03F7/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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