发明名称 |
DEVICE FOR MEASURING DISTRIBUTION OF ELECTRON BEAM |
摘要 |
PROBLEM TO BE SOLVED: To more precisely and over a longer time measure spatial distribution of the amount of an irradiated electron beam in a wide current range, even through the amount of the irradiation onto an object locally varies when the intensity of an electron beam fluctuates spatially in a domain of an electron beam irradiator irradiated with the electron beam. SOLUTION: Many current measurement probes are placed right under an electron beam irradiation window and are grounded by way of resistance to measure a current flowing via each of the current measurement probes. The measured current shows the spatial distribution of an electron beam current in the irradiated region.
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申请公布号 |
JP2001221897(A) |
申请公布日期 |
2001.08.17 |
申请号 |
JP20000034579 |
申请日期 |
2000.02.14 |
申请人 |
NISSIN HIGH VOLTAGE CO LTD |
发明人 |
SHIMAOKA YOSHIHARU;SUGITA TATSUNOBU |
分类号 |
H01J37/04;G01T1/29;G21K5/04;(IPC1-7):G21K5/04 |
主分类号 |
H01J37/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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