发明名称 DEVICE FOR MEASURING DISTRIBUTION OF ELECTRON BEAM
摘要 PROBLEM TO BE SOLVED: To more precisely and over a longer time measure spatial distribution of the amount of an irradiated electron beam in a wide current range, even through the amount of the irradiation onto an object locally varies when the intensity of an electron beam fluctuates spatially in a domain of an electron beam irradiator irradiated with the electron beam. SOLUTION: Many current measurement probes are placed right under an electron beam irradiation window and are grounded by way of resistance to measure a current flowing via each of the current measurement probes. The measured current shows the spatial distribution of an electron beam current in the irradiated region.
申请公布号 JP2001221897(A) 申请公布日期 2001.08.17
申请号 JP20000034579 申请日期 2000.02.14
申请人 NISSIN HIGH VOLTAGE CO LTD 发明人 SHIMAOKA YOSHIHARU;SUGITA TATSUNOBU
分类号 H01J37/04;G01T1/29;G21K5/04;(IPC1-7):G21K5/04 主分类号 H01J37/04
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