| 摘要 |
PROBLEM TO BE SOLVED: To provide an ion trap mass spectrometer having an electron impact(EI) ion source, which can prevent a random noise at mass analysis. SOLUTION: Two gates are provided between the filament and end-cap electrodes. Positive/negative voltage is impressed to the two electrodes so that either ion or electron does not enter the ion trap space at mass analysis. This serves to prevent a random noise on the mass spectrum and enable measurement of minute components of mass spectrum. Also, a noise on the chromatogram is prevented and quantitative analysis of minute components is enabled.
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