发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide the manufacturing method of a semiconductor device, which efficiently forms circuit surfaces of a high flatness in a short time while preventing dishing effectively from being generated in a process that the circuits of wirings or the like at the time of the manufacture of the device are formed by a polishing. SOLUTION: A laminated material of a structure that an insulating film 2 provided with recessed parts A for forming wirings is laminated on a semiconductor substrate and a matal film 4 is laminated on the surface of the film 2 comprising the recessed parts via a barrier film 3 is constituted and after a primary polishing process that the film 4 of the laminated material is polished at a high speed in such a way that one part of the film 4 remains on the film 3, in a layer form is executed, a secondary polishing process that a polishing of the remaining film 4 simultaneous with a polishing of the films 2 and 4 is performed using an abrasive, which is slow in the polishing rate of the film 4 and has the ratio of the polishing rate of the film 3 to the polishing rate of the film 4 or more than 0.5 to 1 and the ratio of the polishing rate of the film 4 to the polishing rate of the film 2 of more than 05 to 1, is executed.
申请公布号 JP2001223216(A) 申请公布日期 2001.08.17
申请号 JP19990348300 申请日期 1999.12.08
申请人 TOKUYAMA CORP 发明人 KATO HIROSHI;MOCHIZUKI NAOTO;HAYASHI KAZUHIKO
分类号 H01L21/3205;H01L21/28;H01L21/304;H01L23/52;(IPC1-7):H01L21/320 主分类号 H01L21/3205
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