TESTING APPARATUS AND METHOD

摘要

PROBLEM TO BE SOLVED: To attain a higher trouble coverage with a shorter test length by reducing the number of necessary hardwares. SOLUTION: Original test vectors stored in an ROM 4 are shifted alternately into two shift registers SR-A2 and SR-B3 on a vector basis. The vectors in the shift registers SR-A2 and SR-B3 are shifted into multiplexers MUX5-1, 5-2 and 5-3 alternately together with pseudo random vectors generated by an LFSR1, to be mutually multiplexed. The multiplexed vectors are mixed vectors, and are printed to a CUT6 separately from the multiplexers MUX5-1, 5-2 and 5-m.