发明名称 METHOD FOR MANUFACTURING SPIN-ON-GLASS LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for manufacturing a spin-on-glass(SOG) layer of a semiconductor device is provided to stably control a subsequent process by forming the SOG layer of a predetermined thickness, and to reduce defects by improving a process margin. CONSTITUTION: A density of ozone in a process for manufacturing a spin-on-glass(SOG) layer is uniformly maintained. The ozone density maintains a uniform range in a soft bake process and a spin coating process out of the process for forming the SOG layer. The ozone density can be from zero to 500 parts per million(PPM).
申请公布号 KR20010077274(A) 申请公布日期 2001.08.17
申请号 KR20000004950 申请日期 2000.02.01
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI, JEONG SIK;HAN, CHAN HUI;KANG, DAE WON;KIM, HONG GI
分类号 H01L21/316;(IPC1-7):H01L21/316 主分类号 H01L21/316
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