发明名称 |
METHOD FOR MANUFACTURING SPIN-ON-GLASS LAYER OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for manufacturing a spin-on-glass(SOG) layer of a semiconductor device is provided to stably control a subsequent process by forming the SOG layer of a predetermined thickness, and to reduce defects by improving a process margin. CONSTITUTION: A density of ozone in a process for manufacturing a spin-on-glass(SOG) layer is uniformly maintained. The ozone density maintains a uniform range in a soft bake process and a spin coating process out of the process for forming the SOG layer. The ozone density can be from zero to 500 parts per million(PPM).
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申请公布号 |
KR20010077274(A) |
申请公布日期 |
2001.08.17 |
申请号 |
KR20000004950 |
申请日期 |
2000.02.01 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
CHOI, JEONG SIK;HAN, CHAN HUI;KANG, DAE WON;KIM, HONG GI |
分类号 |
H01L21/316;(IPC1-7):H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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