发明名称 |
Method for manufacturing a capacitor for semiconductor devices |
摘要 |
A capacitor for a semiconductor device is manufactured by forming a lower structure on a semiconductor device, forming a lower electrode on the lower structure of the semiconductor device, forming a dielectric thin film by depositing an amorphous TaON film on the surface of the lower electrode, and supplying a Ta source gas in a mono-pulse manner and continuously supplying a reaction gas even when the Ta source gas is not supplied, and forming an upper electrode on the upper portion of the dielectric thin film.
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申请公布号 |
US2001014510(A1) |
申请公布日期 |
2001.08.16 |
申请号 |
US20010751843 |
申请日期 |
2001.01.02 |
申请人 |
PARK DONG SU;AHN BYOUNG KWON |
发明人 |
PARK DONG SU;AHN BYOUNG KWON |
分类号 |
H01L27/108;C23C16/30;H01L21/02;H01L21/316;H01L21/8242;(IPC1-7):H01L21/823;H01L21/824;H01L21/20 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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