发明名称 Method for manufacturing a capacitor for semiconductor devices
摘要 A capacitor for a semiconductor device is manufactured by forming a lower structure on a semiconductor device, forming a lower electrode on the lower structure of the semiconductor device, forming a dielectric thin film by depositing an amorphous TaON film on the surface of the lower electrode, and supplying a Ta source gas in a mono-pulse manner and continuously supplying a reaction gas even when the Ta source gas is not supplied, and forming an upper electrode on the upper portion of the dielectric thin film.
申请公布号 US2001014510(A1) 申请公布日期 2001.08.16
申请号 US20010751843 申请日期 2001.01.02
申请人 PARK DONG SU;AHN BYOUNG KWON 发明人 PARK DONG SU;AHN BYOUNG KWON
分类号 H01L27/108;C23C16/30;H01L21/02;H01L21/316;H01L21/8242;(IPC1-7):H01L21/823;H01L21/824;H01L21/20 主分类号 H01L27/108
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