发明名称 SYSTEM OF MEASURING PROPERTY OF LOW VOLTAGE PHOSPHOR
摘要 PURPOSE: A system of measuring a property of a low voltage phosphor is provided to allow to analyze the property of a phosphor before a display device is manufactured, thereby improving the productivity of the display device. CONSTITUTION: In a system of measuring a property of a low voltage phosphor, a vacuum chamber(12) maintains a vacuum state. A sample tube is mounted in the vacuum chamber and includes a low voltage phosphor sample. A filament is mounted in the vacuum chamber to emit a thermal electron upon applying a voltage. A sensing device is mounted in the vacuum chamber to sense the sated-radiative of a low voltage phosphor sample placed on the sample tube. A mesh grid(36) is provided between the filament and the sample tube to accelerate the thermal electrons emitted from the filament toward the sample tube.
申请公布号 KR20010076583(A) 申请公布日期 2001.08.16
申请号 KR20000003794 申请日期 2000.01.26
申请人 SAMSUNG SDI CO., LTD. 发明人 KIM, IN;PARK, HYEONG GEUN;PARK, SEONG GYU
分类号 H01J9/42;(IPC1-7):H01J9/42 主分类号 H01J9/42
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