发明名称 |
SYSTEM OF MEASURING PROPERTY OF LOW VOLTAGE PHOSPHOR |
摘要 |
PURPOSE: A system of measuring a property of a low voltage phosphor is provided to allow to analyze the property of a phosphor before a display device is manufactured, thereby improving the productivity of the display device. CONSTITUTION: In a system of measuring a property of a low voltage phosphor, a vacuum chamber(12) maintains a vacuum state. A sample tube is mounted in the vacuum chamber and includes a low voltage phosphor sample. A filament is mounted in the vacuum chamber to emit a thermal electron upon applying a voltage. A sensing device is mounted in the vacuum chamber to sense the sated-radiative of a low voltage phosphor sample placed on the sample tube. A mesh grid(36) is provided between the filament and the sample tube to accelerate the thermal electrons emitted from the filament toward the sample tube.
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申请公布号 |
KR20010076583(A) |
申请公布日期 |
2001.08.16 |
申请号 |
KR20000003794 |
申请日期 |
2000.01.26 |
申请人 |
SAMSUNG SDI CO., LTD. |
发明人 |
KIM, IN;PARK, HYEONG GEUN;PARK, SEONG GYU |
分类号 |
H01J9/42;(IPC1-7):H01J9/42 |
主分类号 |
H01J9/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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