| 摘要 |
<p>A spectroscopic investigation system comprises: a source (LS) of a polychromatic beam; a polarizer (P); a stage (STG) for supporting a material system to be investigated; an analyser (A); at least one detector system (DET); and at least one compensator (C) (C') (C'') continuously rotated during operation. The compensator comprises a combination of at least two zero-order wave plates (MOA, MOB), having their respective fast axes offset from zero or ninety degrees with respect to one another; or a combination of at least a first and a second effective zero-order wave plate (ZO1, ZO2), each effective zero-order wave plate comprising two multiple order wave plates (MOA1, MOA2, MOB1, MOB2) which are combined with the fast axes thereof oriented at substantially ninety degrees to one another; or a combination of at least one zero-order wave plate (MOA , MOB), and at least one effective zero-order wave plate (ZO2, ZO1). <IMAGE> <IMAGE></p> |
