发明名称 Method of manufacturing borderless contact
摘要 A method of manufacturing borderless contact can compensate for misalignment that occurs during formation of the contacts. First, a substrate with a gate structure on it is provided. The substrate also has source/drain regions. Spacers are formed on the sidewalls of the gate structure. Thereafter, an insulating layer conformal to the substrate profile is formed over the substrate. Then, a portion of the insulating layer is removed so that the remaining isolating layer at least covers the gate structure and the source/drain regions. Next, a dielectric layer having openings is formed over the insulating layer, and then a portion of the insulating layer at the bottom of the openings is removed to expose the source/drain region, thereby forming contact openings. Finally, conductive material is deposited into the contact openings to form contacts that couple electrically with the respective source/drain regions.
申请公布号 US6274468(B1) 申请公布日期 2001.08.14
申请号 US19980173487 申请日期 1998.10.04
申请人 UNITED MICROELECTRONICS CORP. 发明人 HSU CHEN-CHUNG
分类号 H01L21/60;H01L21/768;(IPC1-7):H01L21/320 主分类号 H01L21/60
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