发明名称 |
ABRASIVE PAD, POLISHING METHOD AND METHOD OF MANUFACTURING WORK PIECE BY USING ABRASIVE PAD |
摘要 |
PROBLEM TO BE SOLVED: To constantly keep the deformation characteristic of an abrasive pad in polishing to stably polish a wafer. SOLUTION: A through hole is formed from a surface of the abrasive pad to the abrasive pad of a lower layer so that the gas or the liquid included in the abrasive pad of the lower layer are movable through the through hole. |
申请公布号 |
JP2001219364(A) |
申请公布日期 |
2001.08.14 |
申请号 |
JP20000032735 |
申请日期 |
2000.02.04 |
申请人 |
HITACHI LTD |
发明人 |
OKAWA TETSUO;KOJIMA HIROYUKI;SATO HIDEMI |
分类号 |
B24B37/20;B24B37/22;B24B37/26;B24B53/017;H01L21/304 |
主分类号 |
B24B37/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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