发明名称 ABRASIVE PAD, POLISHING METHOD AND METHOD OF MANUFACTURING WORK PIECE BY USING ABRASIVE PAD
摘要 PROBLEM TO BE SOLVED: To constantly keep the deformation characteristic of an abrasive pad in polishing to stably polish a wafer. SOLUTION: A through hole is formed from a surface of the abrasive pad to the abrasive pad of a lower layer so that the gas or the liquid included in the abrasive pad of the lower layer are movable through the through hole.
申请公布号 JP2001219364(A) 申请公布日期 2001.08.14
申请号 JP20000032735 申请日期 2000.02.04
申请人 HITACHI LTD 发明人 OKAWA TETSUO;KOJIMA HIROYUKI;SATO HIDEMI
分类号 B24B37/20;B24B37/22;B24B37/26;B24B53/017;H01L21/304 主分类号 B24B37/20
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