发明名称 Semiconductor memory device having global bit line precharge circuits
摘要 A semiconductor memory device includes: a global I/O line pair having a global I/O line and a complementary global I/O line; a data I/O buffer unit, coupled to the global I/O line pair; a plurality of banks, coupled to the global I/O line pair, for storing data, said banks including: a first bank coupled to the global I/O line pair; and a second bank coupled to the global I/O line pair, wherein the second bank is located closer to the data I/O buffer unit than the first bank is; a control signal generating unit for generating a control signal, said control signal has a first level and a second level in a read operation and a write operation, respectively; a first precharge unit located closely to said first bank, said first precharge unit sensing a level transition of the global I/O line pair and precharging the global I/O line pair in response to the control signal of the second level in a write operation; and a second precharge unit located closely to said second bank, said second precharge unit sensing a level transition of the global I/O line pair and precharging the global I/O line pair in response to an inverted signal of the control signal in the read operation.
申请公布号 US6275430(B1) 申请公布日期 2001.08.14
申请号 US20000604685 申请日期 2000.06.27
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 KA SOON-TAEG
分类号 G11C11/407;G11C7/10;G11C11/401;G11C11/409;G11C11/4096;(IPC1-7):G11C7/12 主分类号 G11C11/407
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