发明名称 In-situ automated CMP wedge conditioner
摘要 An apparatus and method of conditioning a CMP polishing pad to ensure consistent polishing throughout the polishing process. In particular, the apparatus consists of a translatable wedge-shaped conditioning plate, having a three point adjustable contact to ensure proper alignment with the polishing pad; a high pressure conditioning spray nozzle to clean the polishing pad and conditioning assembly throughout polishing; and a slurry dispensing nozzle to enhance planarization of the wafer. Further, the frequency of oscillation may be varied by the operator to prevent grooves from forming in the polishing pad.
申请公布号 US6273797(B1) 申请公布日期 2001.08.14
申请号 US19990444285 申请日期 1999.11.19
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BECKER KENT R.;CLINE SCOTT R.;MANFREDI PAUL A.;NADEAU DOUGLAS P.
分类号 B24B37/04;B24B53/007;B24B53/12;(IPC1-7):B24B1/00 主分类号 B24B37/04
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