发明名称 Semiconductor structure having interconnects on a projecting region and substrate
摘要 A region is formed in a semiconductor substrate and extends beyond the substrate surface. First and second interconnects each having a predetermined thickness and a surface approximately parallel to the substrate surface are formed on the region. The first and second interconnects define a trench therebetween. A third interconnect is formed on the substrate. The thicknesses of the first and second interconnects are reduced a first amount to improve the aspect ratio of the trench, to improve the cross-sectional profile of the trench, or both. The thickness of the third strip is reduced a second amount. The second amount may be smaller than the first amount.
申请公布号 US6274897(B1) 申请公布日期 2001.08.14
申请号 US19990339716 申请日期 1999.06.24
申请人 MICRON TECHNOLOGY, INC. 发明人 BLALOCK GUY;MEIKLE SCOTT;KIM SUNG;PRALL KIRK
分类号 H01L21/768;(IPC1-7):H01L27/108 主分类号 H01L21/768
代理机构 代理人
主权项
地址