发明名称 SEMICONDUCTOR STORAGE UNIT AND SEMICONDUCTOR TEST METHOD
摘要 PURPOSE: To provide a semiconductor storage unit having quick access speed. CONSTITUTION: In a DRAM 1, a selector 34 selects data of one bit out of data of four bits read out from a memory section 33, and the data DO is given to a data output buffer 41. The data output buffer 41 is controlled by an output permission signal ZOE' generated from a discrimination signal JDO and the like, when the data of four bits are coincident mutually, the data DO from the selector 34 is given to a data input/output terminal T0, when they are not coincident, the data input/output terminal TO is made to be a high impedance state. As a selector 40 selecting either of the read-out data DO and the discrimination signal JDO is not required, delay of the read-out data DO caused by the selector 40 can be prevented.
申请公布号 KR20010076195(A) 申请公布日期 2001.08.11
申请号 KR20000054560 申请日期 2000.09.18
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TANIMURA MASAAKI
分类号 G11C11/401;G01R31/28;G01R31/3185;G11C29/14;G11C29/26;G11C29/34;(IPC1-7):G11C29/00 主分类号 G11C11/401
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