发明名称 |
MANUFACTURING METHOD OF SEMICONDUCTOR, MANUFACTURING METHOD OF FLASH MEMORY, MANUFACTURING METHOD OF STATIC RANDOM ACCESS MEMORY, AND FLASH MEMORY |
摘要 |
PURPOSE: To provide a method for manufacturing a semiconductor device that has been improved to prevent a modified resist surface layer from being released when continuously performing dry etching and wet etching by the same resist pattern. CONSTITUTION: An insulation film 2 and a conductive layer 3 are successively formed on a semiconductor substrate 1. A resist pattern 4 is formed on the conductive layer 3. By using the resist pattern 4 as a mask, the conductive layer 3 is subjected to dry etching. The surface-layer part of the resist pattern 4 is partially scraped. By using the resist pattern 4 as a mask, the insulation film 2 is subjected to wet etching.
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申请公布号 |
KR20010076178(A) |
申请公布日期 |
2001.08.11 |
申请号 |
KR20000049483 |
申请日期 |
2000.08.25 |
申请人 |
MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION |
发明人 |
SHIMIZU SYU;TANAKA TAMOTSU;YANO TAKASHI;YUZURIHA KOJIRO |
分类号 |
H01L21/8244;H01L21/8247;H01L27/105;H01L27/11;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8244 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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