发明名称 MANUFACTURING METHOD OF SEMICONDUCTOR, MANUFACTURING METHOD OF FLASH MEMORY, MANUFACTURING METHOD OF STATIC RANDOM ACCESS MEMORY, AND FLASH MEMORY
摘要 PURPOSE: To provide a method for manufacturing a semiconductor device that has been improved to prevent a modified resist surface layer from being released when continuously performing dry etching and wet etching by the same resist pattern. CONSTITUTION: An insulation film 2 and a conductive layer 3 are successively formed on a semiconductor substrate 1. A resist pattern 4 is formed on the conductive layer 3. By using the resist pattern 4 as a mask, the conductive layer 3 is subjected to dry etching. The surface-layer part of the resist pattern 4 is partially scraped. By using the resist pattern 4 as a mask, the insulation film 2 is subjected to wet etching.
申请公布号 KR20010076178(A) 申请公布日期 2001.08.11
申请号 KR20000049483 申请日期 2000.08.25
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA;RYODEN SEMICONDUCTOR SYSTEM ENGINEERING CORPORATION 发明人 SHIMIZU SYU;TANAKA TAMOTSU;YANO TAKASHI;YUZURIHA KOJIRO
分类号 H01L21/8244;H01L21/8247;H01L27/105;H01L27/11;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8244
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