发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To enhance the reliability of connection of a bump electrode as an external terminal. SOLUTION: The semiconductor device is composed of a tape substrate 2 which supports a semiconductor chip 1. The semiconductor device is composed of a bonding material 5 which is arranged between the semiconductor chip 1 and the tape substrate 2, which is formed in a circular shape and which bonds the semiconductor chip 1 and the tape substrate 2. The semiconductor device is composed of bonding wires 4 which connect pads 1a of the semiconductor chip 1 to connecting terminals 2c of the tape substrate 2. The semiconductor device is composed of a plurality of bump electrodes 3 which are installed on the rear 2b of the tape substrate 2. The semiconductor device is composed of stress relaxation parts 7 which are formed in places corresponding to at least circumferential bump electrodes 3a in chip support regions between the semiconductor chip 1 and the tape substrate 2, which are formed in places corresponding to chip corner parts and which relax a stress applied to the bump electrodes 3. The semiconductor device is composed of a sealing part 6 which is formed by resin-sealing the semiconductor chip 1. Thermal stress which is applied to the bump electrodes 3 near the chip corner parts and to the outermost circumferential bump electrodes 3a is realized by the stress relaxation parts 7.
申请公布号 JP2001217261(A) 申请公布日期 2001.08.10
申请号 JP20000021527 申请日期 2000.01.31
申请人 HITACHI LTD;HITACHI HOKKAI SEMICONDUCTOR LTD 发明人 HIRANO TSUGUHIKO;OZAWA HIDEMI
分类号 H01L23/12;H01L21/52;(IPC1-7):H01L21/52 主分类号 H01L23/12
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