发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To enhance the reliability of connection of a bump electrode as an external terminal. SOLUTION: The semiconductor device is composed of a tape substrate 2 which supports a semiconductor chip 1. The semiconductor device is composed of a bonding material 5 which is arranged between the semiconductor chip 1 and the tape substrate 2, which is formed in a circular shape and which bonds the semiconductor chip 1 and the tape substrate 2. The semiconductor device is composed of bonding wires 4 which connect pads 1a of the semiconductor chip 1 to connecting terminals 2c of the tape substrate 2. The semiconductor device is composed of a plurality of bump electrodes 3 which are installed on the rear 2b of the tape substrate 2. The semiconductor device is composed of stress relaxation parts 7 which are formed in places corresponding to at least circumferential bump electrodes 3a in chip support regions between the semiconductor chip 1 and the tape substrate 2, which are formed in places corresponding to chip corner parts and which relax a stress applied to the bump electrodes 3. The semiconductor device is composed of a sealing part 6 which is formed by resin-sealing the semiconductor chip 1. Thermal stress which is applied to the bump electrodes 3 near the chip corner parts and to the outermost circumferential bump electrodes 3a is realized by the stress relaxation parts 7.
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申请公布号 |
JP2001217261(A) |
申请公布日期 |
2001.08.10 |
申请号 |
JP20000021527 |
申请日期 |
2000.01.31 |
申请人 |
HITACHI LTD;HITACHI HOKKAI SEMICONDUCTOR LTD |
发明人 |
HIRANO TSUGUHIKO;OZAWA HIDEMI |
分类号 |
H01L23/12;H01L21/52;(IPC1-7):H01L21/52 |
主分类号 |
H01L23/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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