发明名称 LOW TEMPERATURE POLYCRYSTALLINE SILICON TYPE THIN FILM TRANSISTOR AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a low temperature polycrystalline silicon type thin film transistor on a glass substrate whereby the crystal defect is lessened to improve the quality of a liquid crystal display. SOLUTION: On a glass substrate 10 a silicon nitride film-made blocking layer 11 is formed, an amorphous silicon film 13 is formed thereon as a preliminary film for forming a polycrystalline silicon film, and it is exposed to an oxygen atmosphere to naturally oxidate and instantaneously decomposed and recombined by laser beam scan to convert it into a strongly combined polycrystalline silicon film having no defect, without influencing the glass substrate.
申请公布号 JP2001217428(A) 申请公布日期 2001.08.10
申请号 JP20000142497 申请日期 2000.05.15
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 BUN KOKUTETSU;KIN HYUN-DE;BIN KUNKI
分类号 C01B33/02;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 主分类号 C01B33/02
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