发明名称 |
LOW TEMPERATURE POLYCRYSTALLINE SILICON TYPE THIN FILM TRANSISTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a low temperature polycrystalline silicon type thin film transistor on a glass substrate whereby the crystal defect is lessened to improve the quality of a liquid crystal display. SOLUTION: On a glass substrate 10 a silicon nitride film-made blocking layer 11 is formed, an amorphous silicon film 13 is formed thereon as a preliminary film for forming a polycrystalline silicon film, and it is exposed to an oxygen atmosphere to naturally oxidate and instantaneously decomposed and recombined by laser beam scan to convert it into a strongly combined polycrystalline silicon film having no defect, without influencing the glass substrate.
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申请公布号 |
JP2001217428(A) |
申请公布日期 |
2001.08.10 |
申请号 |
JP20000142497 |
申请日期 |
2000.05.15 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
BUN KOKUTETSU;KIN HYUN-DE;BIN KUNKI |
分类号 |
C01B33/02;H01L21/20;H01L21/336;H01L29/786;(IPC1-7):H01L29/786 |
主分类号 |
C01B33/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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