| 摘要 |
PROBLEM TO BE SOLVED: To provide a static induction beam location detecting device which enables to easily perform fine adjustment of the capacitance of the electrode. SOLUTION: A pair of electrodes provided inside a duct in which charged particles pass, an earth electrically insulated from, an arranged opposite to, the electrodes, and a voltage detecting means for detecting a voltage generated at each of the pair of the electrodes in accordance with passing position of the charge particles constitute the static induction beam location detecting device, which is further provided with a metal piece arranged in the beam axis direction against the electrodes and with a specified gap from them.
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