发明名称 METHOD FOR INSPECTING LUMINOUS DOT-LIKE UNEVENNESS OF LIQUID CRYSTAL PANEL
摘要 <p>PROBLEM TO BE SOLVED: To exactly and easily detect the luminous dot-like unevenness nucleating at the foreign matter visible at a high temperature of a liquid crystal panel. SOLUTION: The presence or absence of the foreign matter in the liquid crystal panel is first detected. Next, the liquid crystal panel which is detected with the presence of the foreign matter is heated for >=1 hour at >=60 deg.C, is then taken out of a thermostatic chamber and is subjected to inspection of the luminous dot-like unevenness within 10 minutes. At this time, the liquid crystal panel is in a high temperature state and therefore only the periphery of the foreign matter having an ion component among respective pieces of the foreign matter existing within the liquid crystal panel may be exactly detected.</p>
申请公布号 JP2001215457(A) 申请公布日期 2001.08.10
申请号 JP20000021631 申请日期 2000.01.31
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KOFUCHI HIROMASA;OGASAWARA SATOSHI
分类号 G01N21/958;G01M11/00;G02F1/13;G02F1/133;G02F1/1345;(IPC1-7):G02F1/13 主分类号 G01N21/958
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