发明名称 METHOD FOR OBSERVING IMAGE AND SCANNING ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a method for observing an image capable of improving the image quality in the process of finding a target area or the like and realize a digital scanning electron microscope. SOLUTION: In finding the target area, a stage controller 8 is controlled by a pointer 20 through a stage control unit 23. During this control, a stage 10 is moved in both X and Y directions, while a sample 4 is transferred. In these procedures, with the pointer 20, the area to be displayed as an image in a cathode ray tube 18, is fixed. Along with the fixing of the area displayed, a scanning area for an electron beam EB is narrowed. Through a multiplication control unit 23, an image multiplication unit 16 is controlled in order to increase cycles of the image multiplication, resulting in achievement of the better image quality.
申请公布号 JP2001216931(A) 申请公布日期 2001.08.10
申请号 JP20000024949 申请日期 2000.02.02
申请人 JEOL LTD 发明人 YAMADA ATSUSHI;NEGISHI TSUTOMU;KOBAYASHI TOSHIJI;WATABE NORIO
分类号 H01J37/22;(IPC1-7):H01J37/22 主分类号 H01J37/22
代理机构 代理人
主权项
地址