发明名称 Information memory refresh device testing method - verifies initial condition of each selected memory cell before switching cell condition using test cycle of resetting memory and subsequent verification of new memory cell conditions
摘要 The testing method verifies the condition of the memory cells selected by a refresh selection device at the beginning of the test cycle, before switching the resetting memory, used for switching each selected memory cell into a fresh condition, into a test mode , with subsequent verification of the new condition of each memory cell. The verification of the original condition of each selected memory cell may be effected by entering a given information in the selected memory cells, causing each selected cell to have the same initial condition, the test mode of the resetting device switching all the selected memory cells into a second condition.
申请公布号 DE10004958(A1) 申请公布日期 2001.08.09
申请号 DE20001004958 申请日期 2000.02.04
申请人 INFINEON TECHNOLOGIES AG 发明人 SPIRKL, WOLFGANG;RICHTER, DETLEV
分类号 G11C29/02;(IPC1-7):G11C29/00;G11C11/406 主分类号 G11C29/02
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