发明名称 |
IMPROVED OPTICAL METHOD FOR MEASURING THIN METAL FILMS |
摘要 |
A method and system for measuring properties of a sample are disclosed. At least one source of excitation radiation is used to irradiate the sample's surface. This excites multiple acoustic modes within the sample. A probe source of radiation diffracts off the acoustic modes to generate a signal beam. The signal beam is detected and analyzed to yield a signal waveform, from which a Fourier Transform spectrum is derived. The Fourier Transform spectrum features frequencies corresponding to the multiple acoustic modes. Analysis of the spectrum yields measurements of the sample's properties.
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申请公布号 |
WO0109586(A3) |
申请公布日期 |
2001.08.09 |
申请号 |
WO2000EP06981 |
申请日期 |
2000.07.19 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
MAZNEV, ALEX |
分类号 |
G01R27/02;G01B11/06;G01N21/00;G01N21/17;G01N29/00;(IPC1-7):G01N21/17;G01J3/30 |
主分类号 |
G01R27/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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