发明名称 |
METHOD AND DEVICE FOR SIMULTANEOUSLY MEASURING MULTIPLE PROPERTIES OF MULTILAYER FILMS |
摘要 |
The invention relates to a method and device for simultaneously measuring multiple properties of a sample composed of multiple layers of films. The measurement features several steps. First, at least one source of excitation radiation irradiates the sample's surface to excite an acoustic mode. A probe source of radiation irradiates the acoustic mode and is diffracted off the surface of the sample to form a signal beam. A detector detects the acoustic mode to generate a signal beam, which is then analyzed to determine an acoustic frequency and an amplitude, a depth of modulation, or a decay constant. These properties are then further analyzed to determine of at least two properties (e.g., a thickness of two layers) of the sample.
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申请公布号 |
WO0109599(A3) |
申请公布日期 |
2001.08.09 |
申请号 |
WO2000EP06804 |
申请日期 |
2000.07.17 |
申请人 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. |
发明人 |
BANET, MATTHEW, J.;SACCO, ROBIN, A. |
分类号 |
G01B17/02;G01B21/08;G01N21/00;G01N29/00;G01N29/24;G01N29/44;(IPC1-7):G01N29/24 |
主分类号 |
G01B17/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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