发明名称 SEMICONDUCTOR DEVICE AND METHOD MANUFACTURING SAME
摘要 A semiconductor device is manufactured by a step of forming a gate electrode on a semiconductor substrate with a gate insulation film therebetween, and using this gate electrode as a mask to implant ions to achieve a high-dose doping of impurities, thereby forming a source/drain region, using an accelerating potential for ion implantation that is lower to a value at which implantation damage is not done to the gate insulation film.
申请公布号 US2001012670(A1) 申请公布日期 2001.08.09
申请号 US19980196415 申请日期 1998.11.19
申请人 MINEJI AKIRA;SHISHIGUCHI SEIICHI;SAITO SHUICHI 发明人 MINEJI AKIRA;SHISHIGUCHI SEIICHI;SAITO SHUICHI
分类号 H01L29/78;H01L21/265;H01L21/266;H01L21/336;(IPC1-7):H01L21/336;H01L21/823 主分类号 H01L29/78
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