发明名称 |
SEMICONDUCTOR DEVICE AND METHOD MANUFACTURING SAME |
摘要 |
A semiconductor device is manufactured by a step of forming a gate electrode on a semiconductor substrate with a gate insulation film therebetween, and using this gate electrode as a mask to implant ions to achieve a high-dose doping of impurities, thereby forming a source/drain region, using an accelerating potential for ion implantation that is lower to a value at which implantation damage is not done to the gate insulation film.
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申请公布号 |
US2001012670(A1) |
申请公布日期 |
2001.08.09 |
申请号 |
US19980196415 |
申请日期 |
1998.11.19 |
申请人 |
MINEJI AKIRA;SHISHIGUCHI SEIICHI;SAITO SHUICHI |
发明人 |
MINEJI AKIRA;SHISHIGUCHI SEIICHI;SAITO SHUICHI |
分类号 |
H01L29/78;H01L21/265;H01L21/266;H01L21/336;(IPC1-7):H01L21/336;H01L21/823 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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