发明名称 Jitter measuring device and method
摘要 A signal to be measured is waveform-formatted to a square waveform that retains the frequency, duty ratio and jitter component of the original signal, and the leading (or trailing) edge of the waveform-formatted output is sampled by a sampling clock of a frequency slightly different from 1/N of the frequency fM of the signal to be measured. The samples are converted by an A/D converter to digital data Vn(t), which is stored in a memory. The difference between the stored digital data Vn(t) and the rise-up characteristic line V'(t) is calculated to detect jitter J'n(t).
申请公布号 US2001012320(A1) 申请公布日期 2001.08.09
申请号 US20010774196 申请日期 2001.01.29
申请人 WATANABE TOSHIFUMI;ANDO AKIHIKO;MIYAJI YUICHI 发明人 WATANABE TOSHIFUMI;ANDO AKIHIKO;MIYAJI YUICHI
分类号 G01R29/02;G01R29/26;G01R31/317;H03L7/091;H04L1/20;H04L25/02;(IPC1-7):H04Q1/20;H04B3/46;H04B17/00;H04L7/00 主分类号 G01R29/02
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