BUILT-IN SELF TEST SCHEMES AND TESTING ALGORITHMS FOR RANDOM ACCESS MEMORIES,申请号KR1020017002338-传众专利搜索

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发明名称	BUILT-IN SELF TEST SCHEMES AND TESTING ALGORITHMS FOR RANDOM ACCESS MEMORIES
摘要
申请公布号	KR20010074847(A)	申请公布日期	2001.08.09
申请号	KR1020017002338	申请日期	2001.02.23
申请人		发明人
分类号	G11C29/00	主分类号	G11C29/00
代理机构		代理人
主权项
地址

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