发明名称 METHOD OF FORMING DRAM TRENCH CAPACITOR WITH METAL LAYER OVER HEMISPHERICAL GRAIN POLYSILICON
摘要 Integrated circuitry capacitors and methods of forming the same are described. In accordance with one implementation, a capacitor plate is formed and a conductive layer of material is formed thereover. Preferably, the conductive layer of material is more conductive than the material from which the capacitor plate is formed. In a preferred implementation, the conductive layer of material comprises a titanium or titanium-containing layer. In another preferred implementation, the capacitor plate comprises an inner capacitor plate having an outer surface with a generally roughened surface area. In one aspect of this implementation, the roughened surface area comprises hemispherical grain polysilicon. Capacitors formed in accordance with the invention are particularly well suited for use in dynamic random access memory (DRAM) circuitry.
申请公布号 US2001012656(A1) 申请公布日期 2001.08.09
申请号 US19990339890 申请日期 1999.06.25
申请人 RHODES HOWARD E.;BREINER LYLE D.;IRELAND PHILIP J.;DOAN TRUNG TRI;SANDHU GURTEJ S.;SHARAN SUJIT 发明人 RHODES HOWARD E.;BREINER LYLE D.;IRELAND PHILIP J.;DOAN TRUNG TRI;SANDHU GURTEJ S.;SHARAN SUJIT
分类号 H01L21/02;H01L21/768;H01L21/8242;H01L29/94;(IPC1-7):H01L21/824;H01G4/06;H01L21/20 主分类号 H01L21/02
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