发明名称 Semiconductor wafer manufacturing method and apparatus for an improved heat exchanger for a photoresist developer
摘要 Embodiments of the invention comprise a new device and technique to realize an improved temperature control for a chemical photoresist developer utilizing a preexisting integrated single reservoir. This improvement is achieved by providing for a modified temperature control unit and procedure. The temperature control unit preferably comprises a plurality of heat exchanger conduits that are each supplied by an inlet manifold, and then exhausted via an outlet manifold. The temperature control unit preferably extends fully within the modified nozzle unit. By utilizing the improved temperature control unit, a first and second volumetric allocation of developer may be issued so that both may be dispensed within a relatively short period of time upon a photoresist layer surface in a temperature controlled state.
申请公布号 US2001012457(A1) 申请公布日期 2001.08.09
申请号 US20010829912 申请日期 2001.04.11
申请人 WAKAMIYA TED;KENT ERIC;MARINARO VINCENT L. 发明人 WAKAMIYA TED;KENT ERIC;MARINARO VINCENT L.
分类号 B05C5/00;B05C11/08;G03F7/30;H01L21/00;(IPC1-7):G03B13/00 主分类号 B05C5/00
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