发明名称 Scan test machine for densely spaced test sites
摘要 <p>A scan tester for printed circuit boards capable of testing densely spaced test locations on the circuit board including a desk top robot having a test head positioned over the circuit board and movable in a three-dimensional plane. The test head includes a non-contact energy source such as a source of plasma located at an end of the test head for energizing the test locations of the printed circuit board. The printed circuit board is mounted on a test fixture having a plurality of translator plates and translator pins for contacting a second surface of the printed circuit board to translate test signals to an electronic test analyzer. &lt;IMAGE&gt;</p>
申请公布号 EP1122546(A2) 申请公布日期 2001.08.08
申请号 EP20010250038 申请日期 2001.02.02
申请人 DELAWARE CAPITAL FORMATION, INC. 发明人 SWART, MARK A.
分类号 G01R1/06;G01R1/067;G01R31/02;G01R31/28;G01R31/302;H05K3/00;(IPC1-7):G01R31/28;G01R31/309 主分类号 G01R1/06
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