发明名称 Method of fabricating a mixed circuit capacitor
摘要 A method for fabricating a capacitor is applicable to a fabrication process for a mixed circuit. The method involves forming a first dielectric layer, a stop layer, and a second dielectric layer on a substrate having a conductive region. A first opening is then formed in the second dielectric layer, followed by forming a second opening in the stop layer and the first dielectric layer, so that the first opening and the second opening form a dual damascene opening for exposing the conductive region. The dual damascene opening is filled with a first conductive layer, so as to form a via plug and a lower electrode of the capacitor for connecting to the conductive region. A third dielectric layer, which is located between the lower electrode and a subsequent formed upper electrode, is then formed over the substrate, so that the lower electrode and a part of the second dielectric layer adjacent to the lower electrode are completely covered by the third dielectric layer. A patterned second conductive layer is formed on a part of the third dielectric layer, whereby an upper electrode for completely covering the lower electrode is formed.
申请公布号 US6271082(B1) 申请公布日期 2001.08.07
申请号 US20000557345 申请日期 2000.04.25
申请人 UNITED MICROELECTRONICS CORP. 发明人 HOU CHIA-HSIN;LIN JYH-KUANG;JUNG TZ-GUEI;KO JOE
分类号 H01L21/02;H01L21/321;H01L21/768;(IPC1-7):H01L21/824 主分类号 H01L21/02
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