发明名称 DEVICE AND METHOD FOR INSPECTING COMPONENT
摘要 PROBLEM TO BE SOLVED: To provide a component inspection device which can precisely inspect a component to be inspected. SOLUTION: The component inspection device has a feeder 2 to transport a component having a head to be inspected in such a state that the component is turned upside down, with its head being directed downward, and a rotation disk 12. The components are transported by the feeder 2 and disk 12 to pass them through an inspection part 10, whereby the components are inspected by the part 10 to separate them into acceptable components and defective components. Since a component with a head is transported in such a state that the component is turned upside down, with its head directed downward, the shape of a side of the component can be precisely detected and moreover the posture of the component is stabilized during transportation. The versatility of the device itself also can be improved.
申请公布号 JP2001212524(A) 申请公布日期 2001.08.07
申请号 JP20000379374 申请日期 2000.12.13
申请人 NITTO SEIKO CO LTD 发明人 HAYASHI KOICHI
分类号 B07C5/10;B65G47/14;(IPC1-7):B07C5/10 主分类号 B07C5/10
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