| 摘要 |
In a photothermal spectroscopic analyzer in which a probe light is made to fall on a thermal lens produced in a sample by an input of an excitation light and the sample is analyzed in accordance with a change of the probe light which is caused by the thermal lens, a light source of excitation light is composed of semiconductor laser light emitting means, and a light source of the probe light is composed of another semiconductor laser light emitting means, and furthermore a condenser lens for focusing the excitation light upon the sample and a condenser lens for focusing the probe light upon the thermal lens are configured by a common condenser lens. Such a photothermal spectroscopic analyzer according to the present invention satisfies all the requirements of small size, low manufacturing cost, high sensitivity, high precision, maintenance free performance, short start-up time, and automatic measurement for such a device as to perform POC analysis. <IMAGE> |
